Kelvin-SPV Measurements of Atomically-Flat Si(111) Surfaces Contaminated with Metallic Ions

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Periodical:

Solid State Phenomena (Volumes 65-66)

Edited by:

Marc Heyns, Marc Meuris and Paul Mertens

Pages:

211-214

DOI:

10.4028/www.scientific.net/SSP.65-66.211

Citation:

T. Tagawa and T. Okumura, "Kelvin-SPV Measurements of Atomically-Flat Si(111) Surfaces Contaminated with Metallic Ions", Solid State Phenomena, Vols. 65-66, pp. 211-214, 1999

Online since:

November 1998

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$35.00

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