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HomeSolid State PhenomenaSolid State Phenomena Vols. 69-70P-N- Junction Peripheral Current Analysis using...

P-N- Junction Peripheral Current Analysis using Gated Diode Measurements

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Gettering and Defect Engineering in Semiconductor Technology VIII

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Periodical:

Solid State Phenomena (Volumes 69-70)

Pages:

437-442

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.69-70.437

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Online since:

August 1999

Authors:

A. Czerwinski, Eddy Simoen, A. Poyai, Cor Claeys

Keywords:

Diode, P-N Junction, Silicon

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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