Intra-Grain Defects - Limiting Factor for Low-Temperature Polycrystalline Silicon Films?
p.95
p.95
Structural Effects in Ultra-Thin Iridium Silicide
p.101
p.101
Hydrogen Diffusion through Deformed Si-Si Bonds at Grain Boundaries in Hot-Wire CVD Polycrystalline Silicon Films
p.109
p.109
Point Defects in Carbon-Rich Polycrystalline Silicon
p.115
p.115
Hydrogen Penetration into Si under Wet Chemical Etching: Experiment and Simulation
p.121
p.121
Comparison of Deposited Polycrystalline Films and Crystallized Silicon from a-Si:H Films
p.127
p.127
Visible Electroluminescence from an ITO/ZnS:Mn/n-Si Device
p.133
p.133
Properties Presented by Tin Oxide Thin Films Deposited by Spray Pyrolysis
p.139
p.139
Structural, Optical and Electrical Properties of Natively Textured ZnO Grown by PECVD for Thin-Film Solar Cell Applications
p.145
p.145
Hydrogen Penetration into Si under Wet Chemical Etching: Experiment and Simulation
Abstract:
You might also be interested in these eBooks
Info:
Periodical:
Solid State Phenomena (Volumes 80-81)
Pages:
121-126
Citation:
Online since:
November 2001
Authors:
Keywords:
Price:
Сopyright:
© 2001 Trans Tech Publications Ltd. All Rights Reserved
Share:
Citation: