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HomeSolid State PhenomenaSolid State Phenomena Vols. 80-81Comparison of Deposited Polycrystalline Films and...

Comparison of Deposited Polycrystalline Films and Crystallized Silicon from a-Si:H Films

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Abstract:

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Polycrystalline Semiconductors VI

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Periodical:

Solid State Phenomena (Volumes 80-81)

Pages:

127-132

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.80-81.127

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Online since:

November 2001

Authors:

G. Farhi, R. Cherfi, M. Aoucher, K. Zellama

Keywords:

Conductivity, Crystallization, Deposition, Optical Absorption, Polycrystalline, Raman Spectroscopy, Silicon

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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