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HomeSolid State PhenomenaSolid State Phenomena Vols. 80-81Structural Effects in Ultra-Thin Iridium Silicide

Structural Effects in Ultra-Thin Iridium Silicide

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Abstract:

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Polycrystalline Semiconductors VI

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Periodical:

Solid State Phenomena (Volumes 80-81)

Pages:

101-108

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.80-81.101

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Online since:

November 2001

Authors:

U. Hörmann, T. Remmele, C. Schür, M. Albrecht, Horst P. Strunk, H. Grünleitner, M. Schulz

Keywords:

Electron Diffraction (ED), Epitaxial Stabilization, Iridium Silicide

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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