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HomeSolid State PhenomenaSolid State Phenomena Vols. 80-81Charge Storage Effects in Si Nanocrystals Embedded...

Charge Storage Effects in Si Nanocrystals Embedded in SiO₂ Thin Films

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Polycrystalline Semiconductors VI

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Periodical:

Solid State Phenomena (Volumes 80-81)

Pages:

243-248

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.80-81.243

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Online since:

November 2001

Authors:

O. González-Varona, B. Garrido, A. Pérez-Rodríguez, Caroline Bonafos, Josep Montserrat, J.R. Morante

Keywords:

Fowler-Nordheim Tunneling, Ion Implantation, Memory Effects, Si Nanocrystal

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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