Spectroscopic Characterisation of Erbium Impurity in Crystalline Silicon

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Periodical:

Solid State Phenomena (Volumes 82-84)

Edited by:

V. Raineri, F. Priolo, M. Kittler and H. Richter

Pages:

657-662

DOI:

10.4028/www.scientific.net/SSP.82-84.657

Citation:

C.A.J. Ammerlaan and I. de Maat-Gersdorf, "Spectroscopic Characterisation of Erbium Impurity in Crystalline Silicon", Solid State Phenomena, Vols. 82-84, pp. 657-662, 2002

Online since:

November 2001

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$35.00

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