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Appropriate pore diameter can elevate the surface area of the photocatalyst, which is a basic requirement for an efficient photocatalyst, both to enhance the adsorption of reactants and to offer a larger number of reactive sites [8, 9].
The crystal form of the BiVO4 could be identified to the monoclinic scheelite type according to JCPDS card no. 14-0688.

The XRD data in this study were compared with BaTiO3 phase (Joint Committee on Powder Diffraction Standard (JCPDS) data file number 06-0399 [12]) because the Ba(Zr0.05Ti0.95)O3 in this research has only a small amount of Zr.
[12] Powder Diffraction File, Card No. 06-0399, Joint Committee for Powder Diffraction Standards (JCPDS) PDF-4, International Centre for Diffraction Data (ICDD) (2000)

When the reaction time increased, the maximum n-paraffin selectivity shifted toward higher C number but levelled off (15%) and the hydrocarbon chain was up to C16.
Results and discussion The results from XRD (not shown here) indicated that the cobalt species in ZrO2-Ru and ZrO2-La promoted cobalt catalysts was in the form of Co3O4 (JCPDS card No. 01-074-1657) with crystallize size of approximately 53.28 and 60.65 nm, respectively using Scherrer’s equation.
From the preliminary reaction testing on Fischer-Tropsch synthesis by the prepared ZrO2-Ru and ZrO2-La promoted cobalt catalysts, the selectivity of C1, C2-C4, and C5+ is shown in Fig.1 and n-paraffin selectivity of each C number is shown in Fig.2.
When the reaction time increased, the maximum n-paraffin selectivity shifted toward higher C number and levelled off (15%) at the carbon range of C2 to C8, and the hydrocarbon chain was up to C16.
From Fig.2 (b), the maximum n-paraffin selectivity of 40% was at C3 and the hydrocarbon chain was up to C6 for the ZrO2-La promoted catalyst and when increasing of reaction time, there was no change in C number.

Fig. 2　FT-IR spectra of the precursors Fig.3　FT-IR spectra of the products The strong absorption band around 890cm-1 in Fig.3 and the band around 855cm-1 in Fig.2 were both assigned to Ce-O stretching vibration, with the shift of wave number from 855 to 890cm-1 that indicated possibly the product ( Fig.3) were pure inorganic CeO2 species in finer particles, compared to the precursors ( Fig.2).
Fig. 4　XRD pattern of the precursors Fig. 5 XRD pattern of the the products It could be seen from Fig. 4 that the diffraction data were in good agreement with the standard spectrum (JCPDS 28-0897), which indicated that the precursor was corresponding to Ce2O(CO3)2·nH2O , namely Ce2O(CO3)2·nH2O with poor crystalline.
For all these diffraction peaks in Fig. 5, not only the peak positions appearing at 2θ= 28.5°, 33.7°, 47.5°, 56.4°and 79.1°, but also their lattice parameters were in accord with that of the standard JCPDS card No. 4-0593 for the standard spectrum of the pure and cubic CeO2.

It can be seen clearly that ATO films show good crystalline when deposited at 500 oC and all diffraction peaks are in agreement with the reflection of cassiterite SnO2 (JCPDS Card No. 88-2348).
(1) where TC(hkl) is the texture coefficient of the (hkl) plane, I(hkl) the measured intensity of (hkl) plane, I0(hkl) the corresponding recorded intensity in JCPDS data file and N the number of preferred directions of the growth.

Results and Discussion Fig. 1a shows the power XRD patterns for the crystalline of NaYF4:18%Yb3+, 2%Er3+, xCa2+ (x = 0 ~ 35%) samples as well as the standard card of pure hexagonal NaYF4 phase for comparison.
All diffraction peaks were in good agreement with the standard XRD pattern of hexagonal NaYF4 (JCPDS No. 16-0334)[9] demonstrated that pure hexagonal NaYF4 crystals were synthesized by the mentioned experiment condition.
Fig. 1 XRD patterns of (a): NaY0.8-xCaxF4:18%Yb3+, 2%Er3+ (x = 0, 5, 15, 25, and 35 mol%) products, standard XRD pattern of hexagonal NaYF4 (JCPDS No. 16-0334), and (b): amplified of the main diffraction peaks (201) at 43° from Fig. 1a.
The SEM images showed the different number of Ca2+ codoped in hexagonal NaYF4:Yb3+, Er3+ crystals in the Fig. 2.

All the phases are in well agreement with the standard JCPDS data.
The data are in good agreement with (01-072-9921) and (00-027-1273) of JCPDS data files.
Starting with 50 mol % of borate concentration, there is an existence of Mg(BO3)(PO4) monoclinic crystal structure phase with JCPDS standard card (00-053-0778).
The spectra consist of a number of sharp lines ranging from 590 to 700 nm, which are associated with the transitions from the excited state 5D0 to 7FJ (J= 1, 2, 3 and 4) levels.
As the Dy3+ ions increases, the number of Dy3+ ions increases and the distance among the activator ions becomes smaller [16].

These peaks align with standard positions in JCPDS card number 44-1294, but exhibit varying intensities and widths compared to pure Ti.
On the porous surface Ti substrate, TiO2 nanostructures annealed at 600°C for 2 hours showed diffraction peaks corresponding to the crystal planes of anatase and rutile TiO2, matching the standard positions in JCPDS 21-1272 and JCPDS 21-1276 (Figure 4).
Specifically, at a current intensity of 1.5A, the number and size of pores on the Ti surface became more uniform and stable, leading to a notably increased surface roughness.
Acknowledgment This research was funded by the Ministry of Education and Training (MOET) under grant number CT2022.03/CT2022.03.BKA.02.

The composite supports are denoted as TiAl(0.25), TiAl(0.12) , TiAl(0.06), where the number in the bracket represents the Ti/Al atomic ratio in the oxidic precursors.
By comparison with JCPDS standard card, it is found that TiO2 and Al2O3 support are present in the form of anatyse and r-alumina, respectively.
According to JCPDS standard card, it is found that for Ni2P/TiO2 catalyst, the characteristic peaks of Ni2P appear at 2θ of 40.7,44.6,54.2,54.9° at reduction final temperature of 600°C and P/Ni atomic ratio of 0.8 .

Annealed at 800˚C, SrFe12O19 ferrite also contained certain other phases, their peaks correspond to impurities like αFe2O3 (JCPDS card No.5-637).
As expected, the degree of crystallinity of ferrite was further increased by increasing the heat treatment temperatures from 800 to 1200˚C where SrFe12O19 (JCPDS card No. 24-1207) single phase was formed.
At the same time, with smaller particle size, the number of defects at surface and interface increase rapidly, which will lead to the multiplication of discrete energy levels.