Books by Keyword: Annealing

Books

Edited by: Bo Monemar, Martin Kittler, Hermann Grimmeiss
Online since: August 2008
Description: Volume is indexed by Thomson Reuters BCI (WoS).
This special-topic volume‚ Advances in Light-Emitting Materials’, makes an important contribution to the field of silicon and III-nitride semiconductors. It begins with a brief history of visible-light emitting diodes. However, silicon is currently expanding from micro-electronics and into photonics. Due to its unsuitable band-gap, it has not previously been the material-of-choice for opto-electronic integration. That is now beginning to change and silicon devices have been developed which have the capability to emit, modulate, guide and detect light and which can be combined with microelectronics to form electronic and photonic integrated circuits.
Edited by: Graeme E. Murch
Online since: August 2008
Description: This periodical edition includes peer-reviewed scientific and engineering papers on all aspects of research in the area of nanoscience and nanotechnologies and wide practical application of the achieved results.
Edited by: P. B. Prangnell and P. S. Bate
Online since: July 2007
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
Deformation and annealing phenomena are of great technical significance to the processing and application of materials at the industrial scale. This edited collection of peer-reviewed papers was designed as a one-off vehicle for reviewing the current understanding of the basic mechanisms and processes that control deformation and annealing in various materials, together with their modelling and simulation. Another aim was to facilitate discussion of the failings of established theories, to explore new ideas, and to identify avenues where future research is required. The present papers apply these concepts to a wide range of materials and applications; from conventional steels and light alloys to nanocrystalline gold wires and geological samples.
Edited by: Jang Hyun Sung, Chan Gyu Lee, Yong Zoo You, Young Kook Lee and Jae Young Kim
Online since: December 2006
Description: The 3rd Asian Conference on the Heat Treatment of Materials (AHTM’05) provided a forum within which engineers, scientists, researchers and production managers could review and discuss recent progress and emerging topics in the fields of Advanced Heat Treatment and Surface Engineering Technology.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
General topics, and various R&D efforts related to heat treatment and surface engineering, were also covered at the Conference.
Edited by: Bernard Pichaud, A. Claverie, Prof. Daniel Alquier, Hans Richter and Martin Kittler
Online since: December 2005
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
This proceedings volume contains 126 contributions from the 11th international meeting on Gettering and Defect Engineering in Semiconductor Technology GADEST 2005 held at “La Badine” at the Giens peninsula south of France.
Edited by: B. Bacroix, J.H. Driver, R. Le Gall, Cl. Maurice, R. Penelle, H. Réglé and L. Tabourot
Online since: October 2004
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
Recrystallization and grain growth, together with phase transformations such as precipitation, are the fundamental processes of microstructural evolution which take place during the thermomechanical processing of engineering materials. They are of major scientific interest and are of great importance in a wide range of industrial applications. One of the main goals of this two-volume set is to show how to cover the entire set of reactions governing recrystallization and grain growth during industrial processing – termed through process modelling.
Edited by: D.L. Beke
Online since: January 2004
Description: This book offers a contemporary overview of nanodiffusion, and details the present state of this rapidly growing field. New conceptions of basic aspects of the diffusion processes occurring at the nanoscale are treated, and many useful insights and results concerning diffusion kinetics in various types of technologically important nanomaterials are presented. The latter include: nanomagnetic materials, consisting of a mixture of magnetic nanoparticles in a residual amorphous magnetic matrix; thin films, bi-layers and multilayers for X-ray or neutron mirrors and for magneto-electronic applications such as GMR; and semiconductor nanosystems for many current and future applications.
Edited by: Dong Nyung Lee
Online since: August 2002
Description: Texture is a fundamental material characteristic which results from the microstructural evolution that takes place during various processes, including the thermomechanical deformation of materials. Therefore, texture-related phenomena will continue to be of great importance, because of their scientific interest as well as their effect upon industrial applications, in the 21st century.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
Edited by: V. Raineri, F. Priolo, M. Kittler and H. Richter
Online since: November 2001
Description: Gettering and Defect Engineering in Semiconductor Technology are discussed here,with particular emphasis being placed on device applications. Fundamental aspects,as well as technological problems which are associated with defects in electronic materials and devices, are addressed.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The topics in this volume were selected on the basis that single-crystal Si, and Si-based, semiconductors will dominate microelectronics until far into the 21st century. The main reason for the overwhelming success of silicon technology is economic: the production cost per area increases by a factor of 5, or even 10, on going from 200 mm Si wafers to compound semiconductors or other substrate materials.
Edited by: H. Tomokage and T. Sekiguchi
Online since: April 2001
Description: The characterisation of semiconductors is of key importance in preparing and applying semiconductors in industry.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The present work deals with theoretical and experimental topics which are related to the assessment of microstructures in semiconductors by means of beam injection and related methods.
Showing 31 to 40 of 52 Books