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Defects and Synchrotron X-Ray Topography in Silicone-Carbide Based Devices
Description:
The presented special edition is devoted to the latest research in semiconductor materials and devices on silicon carbide and the design and research of machines and equipment. This issue will be helpful to specialists engaged in the design and production of power electronics and to mechanical engineers.
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Info:
eBook:
ToC:
Editors:
Dr. Juraj Marek, Dr. Gregor Pobegen and Prof. Ulrike Grossner
THEMA:
TGB, TGM, TJ
BISAC:
TEC008000, TEC009070, TEC021000
Keywords:
Aircraft Fuel Dump, Crystal Structure, Crystalline Defect, Defect Inspection, Dislocations, Epilayer, Friction Stir Welding, Heat Transfer, Landfill Gas, Mass Transfer, Point Defects, Polymer, Semiconductor, Silicon Carbide, Spark Ignition Engine, Surface Defects, Synchrotron X-Ray Topography, Wafer
Details:
Special topic volume with invited peer-reviewed papers only
Pages:
152
Year:
2023
ISBN-13 (softcover):
9783036403328
ISBN-13 (eBook):
9783036413327
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Ringgold Subjects:
Materials Science, Mechanical Engineering, Electronics