This special edition comprehensively overviews state-of-the-art technologies for designing structures and analysing functional characteristics of SiC-based devices and integrated circuits, which, in modern conditions of scientific and technological progress, have wide applications in many engineering and manufacturing fields.

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978-3-0364-0915-3

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eBook:

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ToC:

Table of contents

Editors:

Prof. Victor Veliadis and Dr. Arash Salemi

DOI:

https://doi.org/10.4028/b-zm0oLt

THEMA:

TBN, TJFC, TJFD

BISAC:

TEC008000, TEC020000, TEC021000

Keywords:

Bipolar Diode, Bipolar Junction Transistors, Cell Topology, Channel Density, Electrical Characteristics, Integrated Circuit, MOSFET, Optical Beam Induced Current, PiN Diode, Planar Gate, Power Electronics, Schottky Barrier Diode, Silicon Carbide, Switching Test, TCAD Modelling

Details:

Special topic volume with invited peer-reviewed papers only

Pages:

Year:

2025

ISBN-13 (softcover):

9783036409153

ISBN-13 (eBook):

9783036419152

Permissions:

Creative Commons CC BY 4.0

Ringgold Subjects:

Materials Science, Electronics, Nanoscience