This collection of papers by results of the 11th European Conference on Silicon Carbide and Related Materials 2016 (ECSCRM 2016, 25-29 September, Halkidiki, Greece) reflects the latest progress in the field of wide bandgap semiconductors, focusing on silicon carbide. In addition, it covers some selected aspects in related materials like silicon, graphene, gallium oxide and III-nitrides.

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eBook:

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ToC:

Table of contents

Editors:

Konstantinos Zekentes, Dr. Konstantin Vasilevskiy and Nikolaos Frangis

DOI:

https://doi.org/10.4028/b-xHRft4

THEMA:

PDT, TGM

BISAC:

SCI050000, TEC021000

Keywords:

Applications, MOS, MOSFET Structures, Processing, Properties, Semiconductors, Silicon Carbide, Surface Defects

Details:

Selected, peer reviewed papers from the 11th European Conference on Silicon Carbide and Related Materials 2016 (ECSCRM 2016), September 25-29, 2016, Halkidiki, Greece

Pages:

796

Year:

2017

ISBN-13 (softcover):

9783035710434

ISBN-13 (CD):

9783035720433

ISBN-13 (eBook):

9783035730432

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