HOME
CONTACT
My eBook
Username:
Password:
FULLTEXT SEARCH
NEW:
Advanced Search
MSF
>
Materials Science Forum
KEM
>
Key Engineering Materials
SSP
>
Solid State Phenomena
DDF
>
Defect and Diffusion Forum
AMM
>
Applied Mechanics and Materials
AMR
>
Advanced Materials Research
AST
>
Advances in Science and Technology
JNanoR
>
Journal of Nano Research
JBBTE
>
Journal of Biomimetics, Biomaterials, and Tissue Engineering
JMNM
>
Journal of Metastable and Nanocrystalline Materials
JERA
>
International Journal of Engineering Research in Africa
AEF
>
Advanced Engineering Forum
NH
>
Nano Hybrids
> @scientific.net
CONFERENCE
12/9/2012 - 12/12/2012
ACAM7: The 7th Australasian Congress on Applied Mechanics
11/16/2012 - 11/18/2012
2nd International Conference on Manufacturing Engineering and Automation (ICMEA2012)
11/16/2012 - 11/18/2012
more...
Articles by author: Akira Izumi
9 papers on 1 page:
1
A Novel Copper Interconnection Cleaning by Atomic Hydrogen Using Diluted Hydrogen Gas
Published in:
Ultra Clean Processing of Semiconductor Surfaces IX
(p389)
A Novel Surface Cleaning for Copper Interconnection Using Ammonium Decomposed Species Generated by Hot Wire
Published in:
Ultra Clean Processing of Semiconductor Surfaces VIII
(p307)
Application of Single-Wafer Wet Cleaning Prior to Epitaxial SiGe Process
Published in:
Ultra Clean Processing of Semiconductor Surfaces IX
(p173)
Challenges of Single-Wafer Wet Cleaning for Low Temperature Pre-Epitaxial Treatment of SiGe
Published in:
Ultra Clean Processing of Semiconductor Surfaces VIII
(p243)
Effective Rinse Aiming at Water-Mark-Free Drying for Single-Spin Wet Cleaning Process
Published in:
Ultra Clean Processing of Silicon Surfaces VII
(p79)
Formation of Highly Transparent SiCN Films Prepared by HWCVD
Published in:
Smart Materials & Micro/Nanosystems
(p223)
Novel Photoresist Removal Using Atomic Hydrogen Generated by Heated Catalyzer
Published in:
Ultra Clean Processing of Silicon Surfaces VI
(p231)
Single-Wafer Wet Chemical Oxide Formation for Pre-ALD High-k Deposition on 300 mm Wafer
Published in:
Ultra Clean Processing of Semiconductor Surfaces VIII
(p53)
Structural and Electrical Characterization of Ultra-Thin SiO
2
Films Prepared by Catalytic Oxidation Method
Published in:
Ultra Clean Processing of Silicon Surfaces V
(p157)
Username:
Password: