HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by author: Sergio Pizzini

• About the Electrical Properties of Oxygen Phases Segregated by Annealing Cz Silicon in the 600-800°C Range
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p327)
• Advances in Structural Characterization of Thin Film Nanocrystalline Silicon for Photovoltaic Applications
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p33)
• Analysis of Extended Defects in 6H-SiC Using Photoluminescence and Light Beam Induced Current Spectroscopy
  Published in: Silicon Carbide and Related Materials - 2002 (p317)
• Beam Injection Studies of Dislocations and Oxygen Precipitates in Semiconductor Silicon
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p57)
• Chemistry and Physics of Defect Interaction in Semiconductors
  Published in: Defect Interaction and Clustering in Semiconductors (p1)
• Determination of the Surface Recombination Velocity and of Its Evolution in Monocrystalline Silicon by the Light Beam Induced Current Technique in Planar Configuration
  Published in: Beam Injection Assessment of Defects in Semiconductors (p123)
• Effect of Local Inhomogeneities on the Electrical Properties of Polycrystalline Silicon
  Published in: Polycrystalline Semiconductors III (p219)
• Electrical and Optical Characterization of Electron Irradiated X Rays Detectors Based on 4H-SiC Epitaxial Layers
  Published in: Silicon Carbide and Related Materials 2003 (p1503)
• Electrical Characterization of As-Grown and Thermally Treated 8'' Silicon Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p143)
• Electrical Properties of Oxygen Precipitates Formed During Two Step Low Temperature Annealing
  Published in: Polycrystalline Semiconductors V (p39)
• Erbium in Silicon: Problems and Challenges
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p197)
• Influence of the Host Composition on the Equilibrium Structure of Er-Centers in Silicon
  Published in: Light Emission from Silicon (p86)
• Luminescence of Dislocations and Oxide Precipitates in Si
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p273)
• New Evidences about Carbon and Oxygen Segregation Processes in Polycrystalline Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p181)
• Optical Properties of Oxygen Agglomerates in Silicon
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p75)