Laser-Induced Modification of the Surface State and Optical Properties of CdTe Crystals

Article Preview

Abstract:

Optical properties and surface state of semiconductor CdTe crystals subjected to irradiation with nanosecond laser pulses were studied. Ellipsometric parameters Δ and Ψ were measured on two opposite surfaces of (111) oriented CdTe wafers before. The samples were subjected to polishing chemical etching and laser irradiation with energy densities lower and higher than the melting threshold of CdTe. The morphology and structure of CdTe crystals were monitored before and after treatments. Irradiation formed a thin modified surface layer on the both sides of CdTe crystals (Cd- and Te-terminated) with the similar optical constants n and k, respectively. However, the effective thicknesses of such modified layers differed and depended on the chemical and laser treatment conditions and also on the faces of CdTe(111) crystals.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

28-31

Citation:

Online since:

April 2011

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2011 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Cs. Szeles: Phys. Stat. Sol. B Vol. 241, No 3 (2004), p.783.

Google Scholar

[2] S. Del Sordo, L. Abbene, E. Caroli, A.M. Mancini, A. Zappettini and P. Ubertini: Sensors Vol. 9, Issue 5 (2009), p.3491.

DOI: 10.3390/s90503491

Google Scholar

[3] H. Shiraki, M. Funaki, Y. Ando, A. Tachibana, S. Kominami and R. Ohno: IEEE Trans. Nucl. Sci. Vol. 56, No 4 (2009), p.1717.

DOI: 10.1109/tns.2009.2016843

Google Scholar

[4] V.A. Gnatyuk, T. Aoki, Y. Nakanishi, Y. Hatanaka, Surf. Sci. Vol. 542, No 1 (2003), p.142.

Google Scholar

[5] V.A. Gnatyuk, T. Aoki, O.I. Vlasenko, S.N. Levytskyi, B.K. Dauletmuratov and C.P. Lambropoulos: Appl. Surf. Sci. Vol. 255, No 24 (2009), p.9813.

DOI: 10.1016/j.apsusc.2009.04.096

Google Scholar

[6] K. Yasuda, M. Niraula, K. Nakamura, M. Yokota, I. Shingu, K. Noda, Y. Agata, K. Abe and O. Eryu: J. Electron. Mater. Vol. 36, No 8 (2007), p.837.

DOI: 10.1007/s11664-007-0105-9

Google Scholar

[7] A. Medvid, A. Mychko, O. Strilchyk, N. Litovchenko, Yu. Naseka, P. Onufrievs and, A. Pludons: Nucl. Instrum. Methods A Vol. 607, Issue 1 (2009), p.110.

DOI: 10.1016/j.nima.2009.03.130

Google Scholar

[8] P.D. Brown, K. Durose, G.J. Russell and J Woods: J. Cryst. Growth Vol. 101, Issues 1-4 (1990), p.211.

Google Scholar

[9] K. Suzuki and H. Shiraki: IEEE Trans. Nucl. Sci. Vol. 56, Issue 4, Part 1 (2009), p.1712.

Google Scholar

[10] L.V. Poperenko, D.V. Gnatyuk, V.A. Odarych and T. Aoki: Proceed. of Inter. Workshop on Field Emitter and Semiconductor Materials and Devices (2010), p.15.

Google Scholar

[11] A.Z. Evmenova, V.A. Odarych, F.F. Sizov and M.V. Vuichyk: Optica Applicata Vol. 28, No 3 (2008), p.585.

Google Scholar

[12] R.M.A. Azzam and N.M. Bashara: Ellipsometry and Polarized Light (Elsevier Science Ltd, Amsterdam 1987).

Google Scholar

[13] L.V. Poperenko, V.S. Stashchuk, I.A. Shaikevych and V.A. Odarych: Diagnostics of Surface with Polarized Light (Kyiv University, Kyiv 2007).

Google Scholar

[14] V.A. Gnatyuk, T. Aoki, O.S. Gorodnychenko and Y. Hatanaka: Appl. Phys. Lett. Vol. 83, No 18 (2003), p.3704.

DOI: 10.1063/1.1625777

Google Scholar

[15] D.E. Aspnes and A.A. Studna: Phys. Rev. B, Vol. B27 (1983), p.985.

Google Scholar