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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 284-286X-Ray Photoelectron Spectroscopy of...

X-Ray Photoelectron Spectroscopy of (La_0.7Sr_0.3)MnO₃Thin Films Prepared by Pulsed Laser Deposition

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Abstract:

(La_0.7Sr_0.3)MnO3 (LSMO) thin films were grown on Si (100) substrate by using pulsed laser deposition (PLD) process. Both structure and surface morphology of the films were investigated by X-ray diffraction (XRD) and atomic force microscopy (AFM). Furthermore, the chemical states and chemical composition of the films were determined by X-ray photoelectron spectroscopy (XPS) near the surface. From XRD, the results indicate that the films grown on Si (100) substrates have a single pseudocubic perovskite phase structure with a high (100) orientation. The XPS results show that La, Sr and Mn exist mainly in the forms of perovskite structure and a SrO layer was found on outermost surface. The films resistivity emeasured under room temperature is 6.4´10^-4 W×cm.

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Periodical:

Advanced Materials Research (Volumes 284-286)

Pages:

2191-2197

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.284-286.2191

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Online since:

July 2011

Authors:

Hui Fang Xiong, Tie Dong Cheng, X.G. Tang, Jian Chen, Qiu Xiang Liu

Keywords:

Chemical Composition, LSMO Thin Films, Pulsed Laser Deposition (PLD), Surface Morpholog, X-Ray Photoelectron Spectroscopy (XPS)

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© 2011 Trans Tech Publications Ltd. All Rights Reserved

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