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ZnO Films Deposited on Various Diamond Film Substrates with Different Surface Roughness

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Abstract:

ZnO thin films were deposited by radio frequency (R. F.) magnetron sputtering on various diamond film substrates with different surface roughness. The influence of surface roughness on structural properties and surface morphology of ZnO thin films was investigated by X-ray diffraction (XRD) and atom force microscopy (AFM), respectively. Only on the nanocrystalline and free-standing diamond substrates, ZnO films with preferential c-axis orientation and smooth surface were obtained.

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Periodical:

Advanced Materials Research (Volumes 287-290)

Pages:

2347-2350

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.287-290.2347

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Online since:

July 2011

Authors:

Rong Fan, Lin Jun Wang, Jian Huang, Ke Tang, Ji Jun Zhang, Wei Min Shi, Yi Ben Xia

Keywords:

Diamond, Film, Zinc Oxide (ZnO)

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© 2011 Trans Tech Publications Ltd. All Rights Reserved

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References

[1] K. Yamanouchi, N. Sakurai and T. Satoh: IEEE ultrason symp preceedings (1989), p.351.

Google Scholar

[2] H. Nakahata, S. Fujii, K. Higaki, A. Hachigo, H. Kitabayashi, S. Shikata and N. Fujimori: Semicond. Sci. Technol. Vol.18 (2003), p.96.

DOI: 10.1088/0268-1242/18/3/314

Google Scholar

[3] B. Bi, W. S. Huang, J. Asmussen, B. Golding: Diam. Relat. Mater. Vol. 11 (2002), p.677.

Google Scholar

[4] S. H. Seo: Thin Solid Films Vol. 416 (2002), p.190.

Google Scholar

[5] I. T. Tang H.J. Chen, W. C. Hwang, Y. C. Wang, M.P. Houng, Y.H. Wang: J. Cryst. Growth Vol. 262 (2004), p.461.

Google Scholar

[6] S. S. Lin, J.L. Huang, D.F. Lii: Surf. Coat. Tech. Vol. 176 (2004), p.173.

Google Scholar

[7] Z. B. Fang, Y. S. Tan, X. Q. Liu, Y. Y. Wang: Appl. Surf.Sci. Vol. 241 (2005), p.303.

Google Scholar

[8] J. B. Lee: Thin Solid Films Vol. 447-448 (2004), p.296.

Google Scholar

[9] S. S. Lin, J. L. Huang: Surf. Coat. Tech. Vol. 185 (2004), p.222.

Google Scholar

[10] R. Cebulla, R. Wendt, K. Ellmer: J. Appl. Phys. Vol. 83 (1998), p.1087.

Google Scholar

[11] N. Fijimula, T. Nishihara, S. Goto, J. Xu, T. Ito: J. Cryst. Growth Vol. 130 (1993), p.269.

Google Scholar

[12] W. Walter, S.Y. Chu: Mater. Lett. Vol. 55 (2002), p.67.

Google Scholar

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