Ferroelectric, Dielectric and Pyroelectric Properties of Highly C-Axis -Oriented Nanostructured (Pb,Sr)(Zr,Ti)O₃ Thin Films

Abstract:

Lead strontium zirconate titanate (Pb_0.92Sr_0.08)(Zr_0.65Ti_0.35)O₃ (PSZT) thin films were grown on Pt (111)/Ti/SiO₂/Si(100) substrates using a simple sol-gel method. X-ray diffraction studies confirmed that all the PSZT films undergone various thermal process show highly preferred (001)-orientation. On the surface image of the thin film, many clusters are found, which are composed by grains in size of 0.5-0.8 mm. Between the clusters, the nano-size grain is about 50-80 nm. The root mean square (RMS) roughness of the film surfaces is 5.1 nm. PSZT thin film exhibit excellent ferroelectric behavior, demonstrated by reproducible hystersis loops with high remnant polarization (P_r =49 μC cm^-2) and relative low coercive field (E_c=53.5 kV cm^-1). The pyroelectric coefficients (p) were measured, at 26 °C, the p=215 mC m^-2 K^-1 for PSZT films. The dielectric properties as well as phase transition behavior were characterized and a ferroelectric to paraelectric transition were found in the vicinity of 196 °C.

• Periodical: Advanced Materials Research (Volumes 287-290)
• Pages: 2381-2386
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.287-290.2381
• Online since: July 2011
• Authors: Tie Dong Cheng, Xin Gui Tang, Shu Juan Kuang, Nan Ding, Yan Ping Jiang, Qiu Xiang Liu
• Keywords: Dielectric, Ferroelectricity, Phase Transition, PSZT Thin Films, Pyroelectricity, Sol-Gel (SG)

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