The Effect of Temperature on Field Emission Current

Abstract:

Article Preview

In this paper, we present our recent works on the measurement of field emission performance of silicon tip arrays and investigate the thermal instability of emission current by measuring the emission current as the function of time under three different cooling conditions—natural free radiation,contact conduction and air forced convection respectively. Draw the conclusions that field emission performance of the silicon-based emitters is quite sensitive to the temperature change and resistive heating produced as emission current flowing through the apex of silicon emitters induces the instability of emission current.

Info:

Periodical:

Advanced Materials Research (Volumes 60-61)

Edited by:

Xiaohao Wang

Pages:

461-464

DOI:

10.4028/www.scientific.net/AMR.60-61.461

Citation:

G. H. Zhuang et al., "The Effect of Temperature on Field Emission Current", Advanced Materials Research, Vols. 60-61, pp. 461-464, 2009

Online since:

January 2009

Export:

Price:

$35.00

In order to see related information, you need to Login.