Study of Good Yield and Efficiency in TFT-LCD Module Process

Abstract:

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This paper introduces the TFT-LCD (Tablet Film Transistor Liquid Crystal Displayer) module process that is composed by two stages, JI (JISO) process and MA (Module Assy) process. In JI process, the main defect phenomena are bonding particle and bonding defect, which have a bad effect on the product yield. In MA process, the key factor of the output is the inequality workload to every worker and unbalance of the production line. With the solution of plasma cleaning and pressure diversification, the bonding defect ratio descent from 0.34% to 0.14%. By making workload balance, the efficiency of MA process has been increased.

Info:

Periodical:

Advanced Materials Research (Volumes 69-70)

Edited by:

Julong Yuan, Shiming Ji, Donghui Wen and Ming Chen

Pages:

234-237

DOI:

10.4028/www.scientific.net/AMR.69-70.234

Citation:

Z. L. Chen et al., "Study of Good Yield and Efficiency in TFT-LCD Module Process", Advanced Materials Research, Vols. 69-70, pp. 234-237, 2009

Online since:

May 2009

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Price:

$35.00

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