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Processing-Induced Defects in Epitaxially Grown p- and n-Type SiGe
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Quantitative Measurements of Vacancy Defects in High-Energy Ion-Implanted Si
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Positron Annihilation Studies of Vacancy Defects in Crystalline and Amorphous Si
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Modelling Cu Diffusion into a Ta Barrier
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Transmission Electron Microscopy of the Configuration of Cracks and the Defect Structure near to Cracks in Si
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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 200-202Transmission Electron Microscopy of the...

Transmission Electron Microscopy of the Configuration of Cracks and the Defect Structure near to Cracks in Si

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Defects and Diffusion in Semiconductors IV

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Periodical:

Defect and Diffusion Forum (Volumes 200-202)

Pages:

225-246

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.200-202.225

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Online since:

November 2001

Authors:

Hiroyasu Saka, Suprijadi Suprijadi

Keywords:

Crack Tip, Dislocation, Ductile-Brittle Transition, Focused Ion Beam (FIB), Fracture, TEM

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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