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Investigation of the Dielectric Properties of Cu Based Microwave Absorbers

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Abstract:

In this paper, we present a microwave characterization of some copper-based nanocomposite materials. They are composed of epoxy resin reinforced with copper powders nanostructured at different mechanical milling durations. Main purpose of this work is to probe the material properties such as complex permittivity and conductivity. For that, elementary copper powder were nanostructured via high-energy mechanical milling process. Milled powders were sampled at 3, 12, 33 and 58 hours milling and characterized via X-Ray Diffraction (XRD). The materials were then incorporated into epoxy resin to mold bulk composite structures of 1 mm thickness and a section that matches the R120 waveguide one. Microwave characterization of the bulk composite samples was carried out by a two- port measure of the scattering parameters using a vector network analyzer. The computation of complex dielectric permittivity followed the noniterative approach proposed by A.H. Boughriet. Obtained results are presented in the form of spectra. XRD spectra attest to the structural refinement during mechanical milling. Complex dielectric permittivity and microwave conductivity spectra exhibit the effect of the structural refinement on the microwave absorbing properties.

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Periodical:

Defect and Diffusion Forum (Volume 445)

Pages:

113-122

DOI:

https://doi.org/10.4028/p-nTnRo1

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Online since:

December 2025

Authors:

Kara Farid*, Fadhéla Otmane, Mohammed Azzaz

Keywords:

Mechanical Milling, Noniterative Transmission/Reflection Calculation, Rectangular Wave-Guide, Scattering Parameters, XRD Analysis

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© 2025 Trans Tech Publications Ltd. All Rights Reserved

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* - Corresponding Author

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