Effect of Solution Concentration on ZnO/ZnAl₂O₄ Nanocomposite Thin Films Formation Deposited by Ultrasonic Spray Pyrolysis on Glass and Si(111) Substrates

Abstract:

A complex ZnO/ZnAl₂O₄ heterostructures thin films on glass and Si (111) substrates have been successively obtained by a soft ultrasonic spray pyrolysis (USP) method deposition using the Zn/Al molar ratios concentrations of 0.07/0.13 and 0.1/0.1, respectively. According to (XRD) an ordered zinc oxide (ZnO) and zinc aluminate (ZnAl₂O₄) structures deposited onto glass from the air annealing at 500 °C during 2 hours was observed and confirmed by the (EDX), (FTIR) and Raman spectroscopy techniques. The estimated crystallites size and stress values of ZnO and ZnAl₂O₄ in the ZnO/ZnAl₂O₄/glass film were 19 nm/0.469 GPa and 11 nm/-0.292 GPa, respectively. The lower Zn/Al molar ratio around 0.035/0.06 produced only ZnO as a single phase, suggesting the Al insufficient quantity. The Si (100) substrate with 0.07 Zn molarity conducted to the Zn₂SiO₄/ZnO/ZnAl₂O₄ composite. The Raman integrated intensity bands of ZnO and ZnAl₂O₄ increases with increasing Zn to Al molar ratio (0.1/0.1 comparatively to 0.07/0.13). The ZnO&ZnAl₂O₄ crystallinity enhances as Zn molarity increases. The ZnO films in the composites grow with (002) texture. The TC(hkl) value indicated that ZnAl₂O₄ in the ZnO/ZnAl₂O₄/glass layer is polycrystalline preferentially oriented along the (311) plane. Spinel ZnAl₂O₄ oxide onto Si (111) substrate grown according to the (220) orientation. Crystallites are larger in ZnO/ZnAl₂O₄/Si than in ZnO/ZnAl₂O₄/glass. The ZnO/ZnAl₂O₄ film onto glass substrate is transparent in the visible and near infrared regions and sensitive to UV absorption, as characterized by UV-Vis spectroscopy. The ZnO and ZnAl₂O₄ E_g values in the ZnO/ZnAl₂O₄/glass composite were 3.25 and 3.88 eV, respectively.

• Periodical: Journal of Nano Research (Volume 63)
• Pages: 10-30
• DOI: https://doi.org/10.4028/www.scientific.net/JNanoR.63.10
• Online since: June 2020
• Authors: Sabrina Iaiche*, Chahra Boukaous, David Alamarguy, Abdelkader Djelloul, Djamel Hamana
• Keywords: Glass Substrate, Molarities, Raman Spectroscopy, Si(100), Si(111), USP, XRD, Zn₂SiO₄, ZnO_ZnAl₂O₄ Thin Film

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