Raman Piezo-Spectroscopic Investigation of Microscopic Residual Stresses in Ni-MLCC Devices

Abstract:

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Residual stresses in Ni-MLCC were investigated by Raman microprobe piezo-spectroscopic (PS) methods. The shape of the Raman spectrum of BaTiO3 in Ni-MLCC depended on the angle between the polarizing direction of the incident laser beam and the direction of the internal electrode. From a set of precise calibrations, we show that the orientation dependence arises from the interaction between internal stresses and the polycrystalline microstructure; by taking into account such an orientation dependence, we were able to establish a technique for the measurement of the distribution of residual stresses in Ni-MLCC.

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Periodical:

Edited by:

Masaru Miyayama, Tadashi Takenaka, Masasuke Takata and Kazuo Shinozaki

Pages:

31-36

DOI:

10.4028/www.scientific.net/KEM.301.31

Citation:

T. Sakashita et al., "Raman Piezo-Spectroscopic Investigation of Microscopic Residual Stresses in Ni-MLCC Devices", Key Engineering Materials, Vol. 301, pp. 31-36, 2006

Online since:

January 2006

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$35.00

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