Fabrication of Flat PZT Cantilevers through MEMS Technologies and Application to Optical MEMS

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Abstract:

Flat PZT cantilevers have been successfully fabricated from the Pt/Ti/PZT/Pt/Ti/SiO2/SOI multi-layered structure through MEMS technologies. A displacement of the tip of the cantilever driven at 6 V is measured to be 7.6 μm and the transverse piezoelectric constant calculated from the displacement is –103 pm/V. 1D optical scanners have been designed, simulated, fabricated and tested. The rotation angles of the mirror of the scanners were 60-70% of the simulated values.

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37-40

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January 2006

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© 2006 Trans Tech Publications Ltd. All Rights Reserved

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