Dielectric Properties of Pb(Zr,Ti)O3 Heterolayered Thick Films Fabricated by Screen-Printing Method

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Ferroelectric PZT heterolayered thick films were fabricated by the alkoxide-based sol-gel method. PZT(20/80) and PZT(80/20) paste were made and alternately screen-printed on the alumina substrates. The coating and drying procedure was repeated 4 times to form the heterolayered thick films. The thickness of the PZT heterolayered thick films was approximately 60 μm. All PZT thick films showed the typical XRD patterns of a perovskite polycrystalline structure. The relative dielectric constant and the dielectric loss of the PZT thick films sintered at 1050oC were 283 and 1.90%, respectively.

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Periodical:

Key Engineering Materials (Volumes 336-338)

Edited by:

Wei Pan and Jianghong Gong

Pages:

381-383

DOI:

10.4028/www.scientific.net/KEM.336-338.381

Citation:

S. G. Lee et al., "Dielectric Properties of Pb(Zr,Ti)O3 Heterolayered Thick Films Fabricated by Screen-Printing Method", Key Engineering Materials, Vols. 336-338, pp. 381-383, 2007

Online since:

April 2007

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$35.00

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