Dielectric Properties of Pb(Zr,Ti)O3 Heterolayered Thick Films Fabricated by Screen-Printing Method

Sung Gap Lee; Young Jae Shim; Cheol Jin Kim; Won Tae Bae; Kyu Hong Hwang; Young Hie Lee; Jun Ki Chung

doi:10.4028/www.scientific.net/KEM.336-338.381

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HomeKey Engineering MaterialsKey Engineering Materials Vols. 336-338Dielectric Properties of Pb(Zr,Ti)O3 Heterolayered...

Dielectric Properties of Pb(Zr,Ti)O₃ Heterolayered Thick Films Fabricated by Screen-Printing Method

Abstract:

Ferroelectric PZT heterolayered thick films were fabricated by the alkoxide-based sol-gel method. PZT(20/80) and PZT(80/20) paste were made and alternately screen-printed on the alumina substrates. The coating and drying procedure was repeated 4 times to form the heterolayered thick films. The thickness of the PZT heterolayered thick films was approximately 60 μm. All PZT thick films showed the typical XRD patterns of a perovskite polycrystalline structure. The relative dielectric constant and the dielectric loss of the PZT thick films sintered at 1050oC were 283 and 1.90%, respectively.

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Key Engineering Materials (Volumes 336-338)

Pages:

381-383

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.336-338.381

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Online since:

April 2007

Authors:

Sung Gap Lee, Young Jae Shim, Cheol Jin Kim, Won Tae Bae, Kyu Hong Hwang, Young Hie Lee, Jun Ki Chung

Keywords:

PZT, Relative Dielectric Constant, Screen Printing, Thick Film

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References

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