Effects of Annealing Temperature on Morphology and Dielectric Property of BiFeO3 Films

Li Li Zhang; G.Q. Tan; Meng Cheng; Hui Jun Ren; Ao Xia

doi:10.4028/www.scientific.net/KEM.512-515.1736

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HomeKey Engineering MaterialsKey Engineering Materials Vols. 512-515Effects of Annealing Temperature on Morphology and...

Effects of Annealing Temperature on Morphology and Dielectric Property of BiFeO₃ Films

Abstract:

Fe(NO₃)₃•9H₂O and Bi(NO₃)₃•5H₂O were used as raw materials. BiFeO₃ thin films were prepared by sol-gel method. The effects of annealing temperatures on the morphology and dielectric property of the thin films were studied. XRD results show that the multi-crystal thin films with pure phase are obtained when annealed at 500°C and 550°C. But annealing at 580°C will lead to the appearance of Bi_2.46Fe₅O₁₂ phase.AFM images show that as the increase of annealing temperatures the surface toughness of the thin film is decreased, but the surface undulation of the thin films is decreased gradually. Within the frequency range of 1KHz~1MHz, the dielectric constant of BiFeO₃ thin films is kept over 125 and it does not change very much from 500°C to 580°C. Annealed at 550°C, the BiFeO₃ thin films with the lower loss are obtained. At 1MHz, the dielectric loss is 0.12.

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Periodical:

Key Engineering Materials (Volumes 512-515)

Pages:

1736-1739

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.512-515.1736

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Online since:

June 2012

Authors:

Li Li Zhang, G.Q. Tan, Meng Cheng, Hui Jun Ren, Ao Xia

Keywords:

BiFeO₃ Thin Film, Dielectric Property, Multi-Ferroic Material, Sol-Gel Method

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