Trapping Characteristics and Analysis of Te-Related DX Centers in AlGaAs and GaAsP

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Periodical:

Materials Science Forum (Volumes 10-12)

Edited by:

H.J. von Bardeleben

Pages:

411-416

DOI:

10.4028/www.scientific.net/MSF.10-12.411

Citation:

E. Muñoz Merino et al., "Trapping Characteristics and Analysis of Te-Related DX Centers in AlGaAs and GaAsP", Materials Science Forum, Vols. 10-12, pp. 411-416, 1986

Online since:

January 1986

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$35.00

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