Stress Effects of Deep Centers in Si, New Method to Determine Old Parameter Ξμ

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Periodical:

Materials Science Forum (Volumes 10-12)

Edited by:

H.J. von Bardeleben

Pages:

469-474

DOI:

10.4028/www.scientific.net/MSF.10-12.469

Citation:

M. F. Li et al., "Stress Effects of Deep Centers in Si, New Method to Determine Old Parameter Ξμ ", Materials Science Forum, Vols. 10-12, pp. 469-474, 1986

Online since:

January 1986

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$35.00

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