Accurate Determination of Capture Time Constant of Interface States in MOS Structures

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Periodical:

Materials Science Forum (Volumes 10-12)

Edited by:

H.J. von Bardeleben

Pages:

499-504

Citation:

D. Vuillaume et al., "Accurate Determination of Capture Time Constant of Interface States in MOS Structures", Materials Science Forum, Vols. 10-12, pp. 499-504, 1986

Online since:

January 1986

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