Application of Optically Detected Magnetic Resonance to the Characterization of Point Defects in Semiconductors

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Periodical:

Materials Science Forum (Volumes 10-12)

Edited by:

H.J. von Bardeleben

Pages:

505-514

DOI:

10.4028/www.scientific.net/MSF.10-12.505

Citation:

J. M. Spaeth "Application of Optically Detected Magnetic Resonance to the Characterization of Point Defects in Semiconductors", Materials Science Forum, Vols. 10-12, pp. 505-514, 1986

Online since:

January 1986

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$35.00

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