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HomeMaterials Science ForumMaterials Science Forum Vols. 10-12Application of Optically Detected Magnetic...

Application of Optically Detected Magnetic Resonance to the Characterization of Point Defects in Semiconductors

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Defects in Semiconductors 14

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Periodical:

Materials Science Forum (Volumes 10-12)

Pages:

505-514

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.10-12.505

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Online since:

January 1986

Authors:

Johann Martin Spaeth

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© 1986 Trans Tech Publications Ltd. All Rights Reserved

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