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HomeMaterials Science ForumMaterials Science Forum Vols. 10-12Analysis of the Electric Field Influence on the...

Analysis of the Electric Field Influence on the Emission Rate of the Te-Related Center in GaAs_0.6P_0.4

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Defects in Semiconductors 14

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Periodical:

Materials Science Forum (Volumes 10-12)

Pages:

533-538

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.10-12.533

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Online since:

January 1986

Authors:

J.R. Morante, P. Roura, A. Pérez-Rodríguez, Josep Samitier, A. Cornet, A. Herms

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© 1986 Trans Tech Publications Ltd. All Rights Reserved

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