Challenges in Extremely Low Specific On-Resistance with SiC SJ-VMOSFETs

Article Preview

Abstract:

A 0.63 mΩcm2 / 1170 V property was demonstrated in a 4H-SiC V-groove trench MOSFET with a super junction (SJ) structure. Successful results in SJ-VMOSFETs will inspire research on 600 to 1200 V class devices as their extreme high MOS channel mobility and the SJ structure is promising.

You might also be interested in these eBooks

Info:

Periodical:

Materials Science Forum (Volume 1004)

Pages:

758-763

Citation:

Online since:

July 2020

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2020 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

[1] T. Kimoto, J. A. Cooper, Fundamentals of Silicon Carbide Technology, Wiley, (2014).

Google Scholar

[2] T. Kimoto, Jpn. J. Appl. Phys. 54 (2015) 040103.

Google Scholar

[3] H. Yano, T. Hirao, T. Kimoto, H. Matsunami, K. Asano and Y. Sugawara, IEEE Elec. Dev. Lett., 20 (1999) 611-613.

Google Scholar

[4] T. Masuda, K. Wada, T. Hiyoshi, Y. Saito, H. Tamaso, M. Sakai, K. Hiratsuka, Y. Mikamura, M. Nishiguchi, T. Hatayama and H. Yano, Mat. Sci. Forum 778-780 (2014) 907-910.

DOI: 10.4028/www.scientific.net/msf.778-780.907

Google Scholar

[5] T. Fujihira, Jpn. J. appl. Phys., 36 (1997) 6254-6262.

Google Scholar

[6] R. Kosugi, Y. Sakuma, K. Kojima, S. Itoh, A. Nagata, T. Yatsuo, Y. Tanaka, and H. Okumura, Int. Symp. Power Semiconductor Devices and ICs (2014) 346-349.

DOI: 10.1109/ispsd.2014.6856047

Google Scholar

[7] Y. Negoro, T. Kimoto, M. Kataoka, Y. Takeuchi, R.K. Malhan and H. Matsunami, Microele. Eng., 83 (2006) 27-29.

Google Scholar

[8] R. Kosugi, S. Ji, K. Mochizuki, H. Kouketsu, Y. Kawada, H. Fujisawa, K. Kojima, Y. Yonezawa and H. Okumura, Jpn. J. Appl. Phys., 56 (2017) 04CR05.

DOI: 10.7567/jjap.56.04cr05

Google Scholar

[9] R. Kosugi, S. Ji, K. Mochizuki, K. Adachi, S. Segawa, Y. Kawada, Y. Yonezawa and H. Okumura, Int. Symp. Power Semiconductor Devices and ICs (2019) 39-42.

DOI: 10.1109/ispsd.2019.8757632

Google Scholar

[10] S. Harada, Y. Kobayashi, K. Ariyoshi, T. Kojima, J. Senzaki, Y. Tanaka and H. Okumura, IEEE Electron Dev. Lett., 37 (2016) 314-316.

DOI: 10.1109/led.2016.2520464

Google Scholar

[11] T. Nakamura, Y. Nakano, M. Aketa, R. Nakamura, S. Mitani, H. Sakairi and Y. Yokotsuji, IEEE IEDM Tech. Dig., Dec. (2011) p.599.

DOI: 10.1109/iedm.2011.6131619

Google Scholar

[12] A. Ichimura, Y. Ebihara, S. Mitani, M. Noborio, Y. Takeuchi, S. Mizuno, T. Yamamoto and K. Tsuruta, Mat. Sci. Forum 924 (2018) 707-710.

DOI: 10.4028/www.scientific.net/msf.924.707

Google Scholar

[13] T. Hiyoshi, T. Masuda, K. Wada, S. Harada and Y. Namikawa, Mat. Sci. Forum 740-742 (2013) 506-509.

DOI: 10.4028/www.scientific.net/msf.740-742.506

Google Scholar

[14] T. Masuda, T. Hatakeyama, S. Harada and H. Yano, Jpn. J. Appl. Phys. 58 (2019) SBBD04.

Google Scholar

[15] K. Uchida, Y. Saitoh, T. Hiyoshi, T. Masuda, K. Wada, H. Tamaso, T. Hatayama, K. Hiratsuka, T. Tsuno, M. Furumai and Y. Mikamura, Int. Symp. Power Semiconductor Devices and ICs (2015) 85-88.

DOI: 10.1109/ispsd.2015.7123395

Google Scholar

[16] H. Nakao, H. Mikami, H. Yano, T. Hatayama, Y. Uraoka and T. Fuyuki, Mat. Sci. Forum 527-529 (2006) 1293-1296.

DOI: 10.4028/www.scientific.net/msf.527-529.1293

Google Scholar

[17] R. Kosugi, Y. Sakuma, K. Kojima, S. Itoh, A. Nagata, T. Yatsuo, Y. Tanaka and H. Okumura, Mat. Sci. Forum 778-780 (2014) 845-850.

DOI: 10.4028/www.scientific.net/msf.778-780.845

Google Scholar

[18] T. Masuda, R. Kosugi and T. Hiyoshi, Mat. Sci. Forum 897 (2017) 483-488.

Google Scholar

[19] T. Masuda, Y. Saito, T. Kumazawa, T. Hatayama and S. Harada, IEEE IEDM Tech. Dig., Dec. (2018) p.177.

Google Scholar

[20] T. Nakamura, Y. Nakano, R. Nakamura, S. Mitani, H. Sakairi, and Y. Yokotsuji, IEEE IEDM Tech. Dig. (2011).

Google Scholar

[21] Y. Nakano, R. Nakamura, H. Sakairi, S. Mitani and T. Nakamura, Mat. Sci. Forum. 717-710 (2012) 1069-1072.

Google Scholar

[22] Y. Ebihara, A. Ichimura, S. Mitani, M.Noborio, Y. Takeuchi, S. Mizuno, T. Yamamoto and K.Tsuruta, Int. Symp. Power Semicond. Devices & Ics (2018) 44-47.

DOI: 10.1109/ispsd.2018.8393598

Google Scholar