Humidity Robustness of 3.3kV SiC-MOSFETs for Traction Applications - Compared to Standard Silicon IGBTs in Identical Packages

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Abstract:

Silicon carbide (SiC) MOSFETs are gaining more and more market share in typical silicon (Si) IGBT applications such as traction or renewable energies. Especially in reliability sensitive traction applications, medium voltage IGBT-modules (3.3 kV-6.5 kV) are widely used and introducing SiC-MOSFETs to such industries is the next self-evident step already on the way. While their superior electrical performance has been generally accepted already (e.g. [1]), SiC-modules have not yet established a track record of high reliability in this voltage class. For this study, 3.3kV SiC-MOSFET-switches were compared to standard Si-IGBTs regarding their humidity robustness under high voltage bias. Both chip types had been assembled in the same traction rated packages to exclude this influence. The Si-IGBTs resembled the well-known industry standard performance, while the SiC-MOSFETs show no degradation within the reported test time of 2000 h. Given the fact [2], that the latest Si-IGBT generation offers a much better humidity performance as well, the standardised HV-H³TRB is no longer sufficient to provoke failures within a reasonable testing time. On the one hand, this suggests that humidity driven failures will not be an issue under field conditions anymore. On the other hand, even harsher tests are required to investigate differences in humidity performance.

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Periodical:

Materials Science Forum (Volume 1092)

Pages:

171-177

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Online since:

June 2023

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* - Corresponding Author

[1] M. Hruska, et al., Benefits of Using the NEW 1700V and 3300V High Power Modules for Traction Applications, PCIM'21 (2021)

Google Scholar

[2] J.-H. Peters et al., Improved HV-H³TRB robustness of a 1700 V IGBT chip set in standard power modules, Microelectronics Reliability Vol. 126, (2021)

DOI: 10.1016/j.microrel.2021.114211

Google Scholar

[3] IEC60749-5:2017, Semiconductor devices – mechanical and climatic test methods, (2017)

Google Scholar

[4] ECPE PSRRA01, HV-H3TRB tests for Power Semiconductor, (2019)

Google Scholar

[5] ECPE AQG324, Qualification of Power Modules for Use in Power Electronics Converter Units in Motor Vehicles, (2021)

Google Scholar

[6] C. Zorn et al., Temperature-humidity-bias testing on insulated-gate bipolartransistor modules-failure modes and acceleration due to high voltage, IET Power Electronics (ISPS2014)

DOI: 10.1049/iet-pel.2015.0031

Google Scholar

[7] I. Voss et al., Reliability and Ruggedness of SiC Trench MOSFETs for Long-Term Applications in Humid Environments, PCIM'18 (2018)

Google Scholar

[8] J. Jormanainen et al., High Humidity, High Temperature and High Voltage Reverse Bias – A Relevant Test for Industrial Applications, PCIM'18 (2018)

Google Scholar

[9] M. Hanf et al., H³TRB Test on 1.2 kV SiC MOSFETs, PCIM'18 (2018)

Google Scholar

[10] F. Hoffmann et al., Comparison of the H3TRB Performance of Silicon and Silicon Carbide Power Modules, ECSCRM'21 (2021)

Google Scholar

[11] P. Salmen et al., Qualifying a Silicon Carbide Power Module: Reliability Testing Beyond the Standards of Silicon Devices, CIPS'22 (2022)

Google Scholar

[12] N. Tanaka et al., Robust HVIGBT module design against high humidity, PCIM'17 (2017)

Google Scholar

[13] Infineon: Whitepaper 07-2020: How Infineon controls and assures the reliability of SiC based power semiconductors, www.infineon.com, (2020)

Google Scholar

[14] F. Hoffmann et al., Investigation on the Impact of Thermo-Mechanical Stress on the Humidity Ruggedness of IGBTs by Means of Consecutive PCT and H3TRB Testing, ISPSD'20 (2020)

DOI: 10.1109/ispsd46842.2020.9170080

Google Scholar