A Novel Contactless SiC Wafer Planarization Processing after Mechanical Slicing by Dynamic Thermal Annealing Processes

Abstract:

In conventional machining of SiC wafers, material loss and sub-surface damage (SSD) of both the front and back surfaces are major issues. In this study, we focused on Dynamic AGE-ing^® (DA), which is a sublimation-controlled process, and applied it to the total wafering process without any mechanical contact of both the front and back surfaces to explore the possibilities to reach the CMP-equivalent quality. DA process enables material lossless planarization of SiC wafers by applying a temperature gradient to achieve simultaneous etching and growth at the same rate on one and the other surfaces, respectively. To drive the planarization function for a multi-wire saw finished as-sliced wafer, as an example, a high-temperature regime above 2000 °C under an Ar background pressure higher than 1 kPa to suppress etching and growth rates was employed as the first step in the DA treatment. In this step, an effective annealing function arises where sublimation and recrystallization occur simultaneously through a sub-surface region on both sides of the wafer. Due to the active interchange of the surface and subsurface layer, a self-organizing planarization effect occurs on a macroscopic scale on both surfaces with the removal of SSD. The conventional DA processes were employed for the following microscopic flatness control. As a result, the roughness of the 6-inch as-sliced wafer was reduced to 0.7 nm on the Si-face and 2.0 nm on the C-face while maintaining the wafer thickness. This is the first promising result exhibiting the potential of thermal contactless treatment for next-generation wafer manufacturing by improving quality and cost.

• Periodical: Materials Science Forum (Volume 1124)
• Pages: 77-84
• DOI: https://doi.org/10.4028/p-IMTf8k
• Online since: August 2024
• Authors: Kohei Toda*, Daichi Kakutani, Daichi Dojima, Yuta Nakajima, Hiroshi Mihara, Tadaaki Kaneko
• Keywords: Annealing, C-Face, Dynamic AGE-ing^®, Machining Process, Material Loss, Multi-Wire Saw, Si-Face, Sublimation Controlled Etching and Growth, Sub-Surface Damage, Thermal Etching

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