Magnetic Resonance Techniques for Excited State Spectroscopy of Defects in Silicon

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 143-147)

Edited by:

Helmut Heinrich and Wolfgang Jantsch

Pages:

1345-1352

Citation:

W.M. Chen et al., "Magnetic Resonance Techniques for Excited State Spectroscopy of Defects in Silicon", Materials Science Forum, Vols. 143-147, pp. 1345-1352, 1994

Online since:

October 1993

Export:

Price:

$38.00