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HomeMaterials Science ForumMaterials Science Forum Vols. 143-147Magnetic Resonance Techniques for Excited State...

Magnetic Resonance Techniques for Excited State Spectroscopy of Defects in Silicon

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Defects in Semiconductors 17

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Periodical:

Materials Science Forum (Volumes 143-147)

Pages:

1345-1352

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.143-147.1345

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Online since:

October 1993

Authors:

W.M. Chen, Bo Monemar, A.M. Frens, M.T. Bennebroek, J. Schmidt

Keywords:

Defect, ESE, Identification, ODMR, Recombination, Silicon

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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