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HomeMaterials Science ForumMaterials Science Forum Vols. 143-147Scanning Tunneling Microscopy of Si Donors in GaAs

Scanning Tunneling Microscopy of Si Donors in GaAs

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Defects in Semiconductors 17

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Periodical:

Materials Science Forum (Volumes 143-147)

Pages:

1319-1324

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.143-147.1319

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Online since:

October 1993

Authors:

Jun-Fei Zheng, X. Liu, N. Newman, Eicke R. Weber, D.F. Ogletree, M.B. Salmeron

Keywords:

GaAs, Hydrogenic Impurity, STM, Surface States

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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