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HomeMaterials Science ForumMaterials Science Forum Vols. 143-147Scanning Tunneling Microscopy and Spectroscopy of...

Scanning Tunneling Microscopy and Spectroscopy of Arsenic Antisite Defects in GaAs

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Defects in Semiconductors 17

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Periodical:

Materials Science Forum (Volumes 143-147)

Pages:

1311-1318

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.143-147.1311

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Online since:

October 1993

Authors:

R.M. Feenstra, J.M. Woodall, G.D. Pettit

Keywords:

Antisite, Coulomb Gap, Defect, EL2, GaAs, STM, Tunneling

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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