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Materials Science Forum Vols. 173-174

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.173-174

ToC:

Table of Contents

Paper Title Page

Raman Studies of Doped Poly-Si Thin Films Prepared by Pulsed Excimer Laser Annealing
Authors: A. Compaan, M.E. Savage, U. Jayamaha, T. Azfar, A. Aydinli
197
Near Infrared Quasi-Elastic Light Scattering Spectroscopy of Electronic Excitations in III-V Semiconductors
Authors: B.H. Bairamov, I.P. Ipatova, G. Irmer, J. Monecke, V.K. Negoduyko, V.A. Voitenko, V.V. Toporov
203
Laser Pulsed Induced Microwave Conductivity and Spectroscopic Ellipsometry Characterization of Helium and Hydrogen Plasma Damage of the Crystalline Silicon Surface
Authors: H.C. Neitzert, N. Layadi, Pere Roca i Cabarrocas, R. Vanderhaghen, M. Kunst
209
Laser Diagnostics of InSb Surface
Authors: G.V. Beketov, A.I. Liptuga
215
Contactless Characterization of Semiconductors Using Laser-Induced Surface Photo-Charge Voltage Measurements
Authors: A. Abbate, P. Rencibia, O. Ivanov, G. Masini, F. Palma, P. Das
221
Narrowing of Photoluminescence Line from Single Quantum Well under High Excitation Levels
Authors: D.G. Revin, V.Ya. Aleshkin
227
Resonance Raman Spectroscopy of Langmuir-Blodgett Films from Metallo-Phthalocyanines
Authors: Liudmila.L. Larina, N.N. Melnik, V.P. Poponin, O.I. Shevaleevskii, A.A. Kalachev
231
Raman and Nonlinear Light Scattering from Undersurface Layers of Ion Implanted Silicon Crystals
Authors: Vladimir Gorelik
237
Raman Study of "Boson Peak" in Amorphous Silicon: Dependence on Hydrogen and Carbon Content
Authors: Mile Ivanda, I. Hartmann, F. Duschek, W. Kiefer
243
Structural Investigation of Microcrystalline Silicon
Authors: P. Hapke, M. Luysberg, Reinhard Carius, F. Finger, H. Wagner
249

Showing 31 to 40 of 56 Paper Titles

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