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HomeMaterials Science ForumMaterials Science Forum Vols. 196-201Direct Experimental Evidence of Autolocalization...

Direct Experimental Evidence of Autolocalization Nature of DX-Centers

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Defects in Semiconductors 18

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Periodical:

Materials Science Forum (Volumes 196-201)

Pages:

1079-1084

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.196-201.1079

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Online since:

November 1995

Authors:

S.D. Ganichev, I.N. Yassievich, W. Prettl, J. Diener, B.K. Meyer, K.W. Benz

Keywords:

DX-Centers, Far-Infrared Radiation, Phonon Assisted Tunnel Ionization

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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