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HomeMaterials Science ForumMaterials Science Forum Vols. 196-201Electrical Detection of Electron Paramagnetic...

Electrical Detection of Electron Paramagnetic Resonance: Studies of the Mechanism of the Spin-Dependent Recombination Process

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Defects in Semiconductors 18

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Periodical:

Materials Science Forum (Volumes 196-201)

Pages:

1509-1514

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.196-201.1509

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Online since:

November 1995

Authors:

Siegmund Greulich-Weber, B. Stich, Johann Martin Spaeth

Keywords:

Donor-Acceptor Recombination, EDEPR, SDR, Thermal Donor

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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