Phonon Spectroscopy of Low-Energy Excitations of Defects in Semiconductors

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Periodical:

Materials Science Forum (Volumes 196-201)

Edited by:

M. Suezawa and H. Katayama-Yoshida

Pages:

1563-1570

DOI:

10.4028/www.scientific.net/MSF.196-201.1563

Citation:

K. Lassmann "Phonon Spectroscopy of Low-Energy Excitations of Defects in Semiconductors", Materials Science Forum, Vols. 196-201, pp. 1563-1570, 1995

Online since:

November 1995

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