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Electrically and Optically Detected Magnetic Resonance Studies of GaN-Based Heterostructures
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Time-Resolved ODMR Measurements on the 'Yellow Luminescence' in MOCVD-Grown GaN Films
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Luminescence of Doped and Undoped Bulk Crystals of GaN
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Photoluminescent Properties of Undoped GaN Prepared by Atmospheric Vapor Phase Epitaxy
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HomeMaterials Science ForumMaterials Science Forum Vols. 196-201Time-Resolved ODMR Measurements on the 'Yellow...

Time-Resolved ODMR Measurements on the 'Yellow Luminescence' in MOCVD-Grown GaN Films

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Defects in Semiconductors 18

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Periodical:

Materials Science Forum (Volumes 196-201)

Pages:

37-42

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.196-201.37

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Online since:

November 1995

Authors:

F.K. Koschnick, Johann Martin Spaeth, E.R. Glaser, K. Doverspike, L.B. Rowland, D. Kurt Gaskill, D.K. Wickenden

Keywords:

Gallium Nitride (GaN), Luminescence, ODMR, Recombination Process, Time-Resolved ODMR

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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