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HomeMaterials Science ForumMaterials Science Forum Vols. 196-201Theory of the NiH2 Complex in Si and the CuH2...

Theory of the NiH₂ Complex in Si and the CuH₂ Complex in GaAs

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Defects in Semiconductors 18

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Periodical:

Materials Science Forum (Volumes 196-201)

Pages:

921-926

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.196-201.921

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Online since:

November 1995

Authors:

R. Jones, Jonathan P. Goss, Sven Öberg, Patrick R. Briddon, A. Resende

Keywords:

Cu, GaAs, H, Nickel Ni, Silicon, Theory, TM Impurities

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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