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HomeMaterials Science ForumMaterials Science Forum Vols. 196-201Hydrogen Induced Degradation in Heavily...

Hydrogen Induced Degradation in Heavily Carbon-Doped GaAs Diodes

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Defects in Semiconductors 18

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Periodical:

Materials Science Forum (Volumes 196-201)

Pages:

957-962

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.196-201.957

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Online since:

November 1995

Authors:

Hiroshi Fushimi, Keiji Wada

Keywords:

CH Complex, Charge State Effect, GaAs:C, Hydrogen, Minority Carrier Injection

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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