Defects Analysis in Strained InAlAs and InGaAs Films Grown on (111)B InP Substrates

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Periodical:

Materials Science Forum (Volumes 258-263)

Edited by:

Gordon Davies and Maria Helena Nazaré

Pages:

1211-1216

DOI:

10.4028/www.scientific.net/MSF.258-263.1211

Citation:

N. Bécourt et al., "Defects Analysis in Strained InAlAs and InGaAs Films Grown on (111)B InP Substrates", Materials Science Forum, Vols. 258-263, pp. 1211-1216, 1997

Online since:

December 1997

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$35.00

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