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HomeMaterials Science ForumMaterials Science Forum Vols. 258-263Mössbauer Spectroscopy of Fe in Silicon with the...

Mössbauer Spectroscopy of Fe in Silicon with the Novel Laser-Ionized ⁵⁷Mn⁺ Ion Beam at Isolde

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Defects in Semiconductors 19

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Periodical:

Materials Science Forum (Volumes 258-263)

Pages:

437-442

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.258-263.437

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Online since:

December 1997

Authors:

G. Weyer, S. Degroote, M. Fanciulli, V.N. Fedoseyev, G. Langouche, V.I. Mishin, A.-M. Van Bavel, A. Vantomme, the ISOLDE Collaboration the ISOLDE Collaboration

Keywords:

Deep-Level Impurities, Fe Impurities in Silicon, Mössbauer Spectroscopy CEMS, Silicon

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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