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HomeMaterials Science ForumMaterials Science Forum Vols. 258-263Cadmium-Related Defects in Silicon:...

Cadmium-Related Defects in Silicon: Electron-Paramagnetic-Resonance Identification

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Defects in Semiconductors 19

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Periodical:

Materials Science Forum (Volumes 258-263)

Pages:

423-428

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.258-263.423

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Online since:

December 1997

Authors:

W. Gehlhoff, A. Näser, M. Lang, Gerhard Pensl

Keywords:

Diffusion, DLTS, Double Acceptor, EPR, Si:Cd

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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