Determination of Stoichiometry and Oxygen Content in Platelike and Octahedral Oxygen Precipitates in Silicon with FT-IR Spectroscopy

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 258-263)

Edited by:

Gordon Davies and Maria Helena Nazaré

Pages:

405-410

DOI:

10.4028/www.scientific.net/MSF.258-263.405

Citation:

O. De Gryse et al., "Determination of Stoichiometry and Oxygen Content in Platelike and Octahedral Oxygen Precipitates in Silicon with FT-IR Spectroscopy", Materials Science Forum, Vols. 258-263, pp. 405-410, 1997

Online since:

December 1997

Export:

Price:

$35.00

In order to see related information, you need to Login.