Raman Scattering Measurements in Neutron-Irradiated Silicon

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 258-263)

Edited by:

Gordon Davies and Maria Helena Nazaré

Pages:

623-628

DOI:

10.4028/www.scientific.net/MSF.258-263.623

Citation:

M. Coeck et al., "Raman Scattering Measurements in Neutron-Irradiated Silicon", Materials Science Forum, Vols. 258-263, pp. 623-628, 1997

Online since:

December 1997

Export:

Price:

$35.00

In order to see related information, you need to Login.